Vacuum birefringence at x-ray free-electron lasers

GND
138718253
ORCID
0000-0003-2239-1789
Zugehörigkeit
Helmholtz-Institut Jena , Fröbelstieg 3, 07743 Jena,Germany
Karbstein, Felix;
GND
1305850505
Zugehörigkeit
Helmholtz-Institut Jena , Fröbelstieg 3, 07743 Jena,Germany
Sundqvist, Chantal;
GND
1098172248
Zugehörigkeit
Helmholtz-Institut Jena , Fröbelstieg 3, 07743 Jena,Germany
Schulze, Kai S;
GND
172550203
Zugehörigkeit
Helmholtz-Institut Jena , Fröbelstieg 3, 07743 Jena,Germany
Uschmann, Ingo;
GND
121558584
Zugehörigkeit
Helmholtz-Institut Jena , Fröbelstieg 3, 07743 Jena,Germany
Gies, Holger;
GND
114845389X
Zugehörigkeit
Helmholtz-Institut Jena , Fröbelstieg 3, 07743 Jena,Germany
Paulus, Gerhard G

We study the perspectives of measuring the phenomenon of vacuum birefringence predicted by quantum electrodynamics using an x-ray free-electron laser (XFEL) alone. We devise an experimental scheme allowing two consecutive XFEL pulses to collide under a finite angle, and thus act as both pump and probe field for the effect. The signature of vacuum birefringence is encoded in polarization-flipped signal photons to be detected with high-purity x-ray polarimetry. Our findings for idealized scenarios underline that the discovery potential of solely XFEL-based setups can be comparable to those involving optical high-intensity lasers. For currently achievable scenarios, we identify several key details of the x-ray optical ingredients that exert a strong influence on the magnitude of the desired signatures.

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Rechteinhaber: © 2021 The Author(s). Published by IOP Publishing Ltd on behalf of the Institute of Physics and Deutsche Physikalische Gesellschaft

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