Absolute distance measurements for in-situ interferometer characterisation using range-resolved interferometry

ORCID
0000-0002-3343-2673
Zugehörigkeit
Institute of Process Measurement and Sensor Technology, Technical University of Ilmenau , PF 100565, Ilmenau, 98694,Germany
Shmagun, Vitalii;
Zugehörigkeit
Institute of Process Measurement and Sensor Technology, Technical University of Ilmenau , PF 100565, Ilmenau, 98694,Germany
Gerhardt, Uwe;
ORCID
0000-0002-6060-7248
Zugehörigkeit
Institute of Process Measurement and Sensor Technology, Technical University of Ilmenau , PF 100565, Ilmenau, 98694,Germany
Fröhlich, Thomas;
ORCID
0000-0002-1672-2978
Zugehörigkeit
Institute of Process Measurement and Sensor Technology, Technical University of Ilmenau , PF 100565, Ilmenau, 98694,Germany
Manske, Eberhard;
ORCID
0000-0003-1832-7143
Zugehörigkeit
Institute of Process Measurement and Sensor Technology, Technical University of Ilmenau , PF 100565, Ilmenau, 98694,Germany
Kissinger, Thomas

Range-resolved interferometry (RRI) allows the simultaneous demodulation of multiple interferometric signal sources and provides a tomographic view of all constituent interferometers that may be present in a setup. Through comparison with a reference distance of known length, absolute distance measurements can be performed. RRI is tailored to the use of laser frequency modulation through injection-current modulation of regular, monolithic laser diodes that are both cost-effective and highly coherent and therefore this approach promises broad applicability. In this paper, two methods for absolute distance measurement, one based on the direct evaluation of the signal peak positions and one based on the phase demodulation of an additional lock-in modulation signal, are experimentally demonstrated. Using an external verification displacement interferometer, both techniques are shown to achieve in-situ absolute distance measurements with systematic errors below over a 50 mm travel range. The aim of this paper is to establish the general suitability of RRI for absolute distance measurements and in-situ tomographic interferometer characterisation for precision engineering. In future, this approach could be used to diagnose interferometric setups for parasitic signal contributions, multiple reflections or to determine the dead path length for accurate environmental compensation, either for use during initial setup of, or for continuous operation alongside, a regular displacement measuring interferometer.

Zitieren

Zitierform:
Zitierform konnte nicht geladen werden.

Rechte

Nutzung und Vervielfältigung: