Measurement of the angular distribution of Dielectronic Recombination into highly charged Krypton ions

Angular distribution of x-rays emitted in the process of Dielectronic Recombination (DR) was studied at the Electron Beam Ion Trap. For this the photon emission spectra were observed along and perpendicular the electron beam propagation direction. X-ray line intensities differ drastically between the two acquired spectra. This indicates a strong alignment of the total angular momentum vector of the excited states populated by DR with respect to the electron beam propagation direction.