Bicrystalline Grain Boundary Junctions of Co-doped and P-doped Ba-122 Thin Films

Zugehörigkeit
Friedrich-Schiller-University Jena, Institute of Solid State Physics, Helmholtzweg 5, 07743 Jena, Germany
Schmidt, S;
GND
1166903400
Zugehörigkeit
Friedrich-Schiller-University Jena, Institute of Solid State Physics, Helmholtzweg 5, 07743 Jena, Germany
Döring, S;
GND
122268407
Zugehörigkeit
Friedrich-Schiller-University Jena, Institute of Solid State Physics, Helmholtzweg 5, 07743 Jena, Germany
Schmidl, F;
Zugehörigkeit
IFW Dresden, Institute for Metallic Materials, Helmholtzstrasse 20, 01069 Dresden, Germany
Kurth, F;
Zugehörigkeit
IFW Dresden, Institute for Metallic Materials, Helmholtzstrasse 20, 01069 Dresden, Germany
Iida, K;
Zugehörigkeit
IFW Dresden, Institute for Metallic Materials, Helmholtzstrasse 20, 01069 Dresden, Germany
Holzapfel, B;
Zugehörigkeit
Nagoya University, Department of Crystalline Materials Science, Chikusa-ku, 4648603 Nagoya, Japan
Kawaguchi, T;
Zugehörigkeit
Nagoya University, Department of Crystalline Materials Science, Chikusa-ku, 4648603 Nagoya, Japan
Mori, Y;
Zugehörigkeit
Nagoya University, Department of Crystalline Materials Science, Chikusa-ku, 4648603 Nagoya, Japan
Ikuta, H;
GND
1068849649
Zugehörigkeit
Friedrich-Schiller-University Jena, Institute of Solid State Physics, Helmholtzweg 5, 07743 Jena, Germany
Seidel, P

We prepared GB junctions of Ba(Fe 0.9 Co 0.1 ) 2 As 2 thin films on bicrystalline [00 l]-tilt SrTiO 3 substrates. The junctions show clear Josephson effects. Electrical characterization shows asymmetric I-V characteristics which can be described within the resistively shunted junction (RSJ) model. A large excess current is observed. Their formal I C R N product is 20.2 μV at 4.2 K, which is decreased to 6.5 μV when taking Iex into account. Fabrication methods to increase this value are discussed. Additionally, measurements on GB junctions of BaFe 2 (As 0.66 P 0.34 ) 2 thin films on LSAT bicrystalline substrates are shown. Their symmetric RSJ/flux flow-behavior exhibits a formal I C R N product of 45 μV, whereas the excess corrected value is ll μV.

Zitieren

Zitierform:
Zitierform konnte nicht geladen werden.

Rechte

Rechteinhaber: Published under licence by IOP Publishing Ltd

Nutzung und Vervielfältigung: